Ballast imported components:IR mos(USA), Ruby Capacitor(Japan),Switch discharge tube(Korea), CPU(Pillips), TKD transformer(Japan) and so on
HID Process of testing: Open circuit protection,Short circuit protection,Short voltage protection,
Overvoltageprotection,Polarity protection, Flash impact test,Warm start-up test, Shockproof/waterproof/dustproof test,
EMC anti-jamming test, High/low temperature condition,
Operating test(40105)
defect rate: 1% to 3%
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